Normal view
MARC view
Precision Landmark Location for Machine Vision and Photogrammetry Электронный ресурс Finding and Achieving the Maximum Possible Accuracy / by Brian S.R. Armstrong, José A. Gutierrez.
Material type: Computer filePublication details: London : Springer-Verlag, 2008ISBN: 9781846289132Subject(s): Automation | Computer vision | Radiology, Medical | Remote sensing | Statistics | Computer Science | Automation and Robotics | Image Processing and Computer Vision | Imaging / Radiology | Remote Sensing/Photogrammetry | Signal, Image and Speech Processing | Statistics for Engineering, Physics, Computer Science, Chemistry & GeosciencesOnline resources: Click here to access online In: Springer e-booksNo physical items for this record
There are no comments on this title.