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Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices Электронный ресурс edited by Josef Sikula, Michael Levinshtein.

By: Sikula, JosefContributor(s): Levinshtein, Michael | SpringerLink (Online service)Material type: Computer fileComputer fileSeries: NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and ChemistryPublication details: Dordrecht : Springer Science + Business Media, Inc., 2005ISBN: 9781402021701Subject(s): Computer engineering | Optical materials | physics | Weights and measures | Physics | Electronic and Computer Engineering | Measurement Science, Instrumentation | Optical and Electronic MaterialsOnline resources: Click here to access online In: Springer e-books
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